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Title: Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
Authors: Behler, AnnaTeichert, NiclasDutta, BiswanathWaske, AnjaHickel, TilmannAuge, AlexanderHütten, AndreasEckert, Jürgen
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Issue Date: 2013
Published in: AIP Advances, Volume 3, Issue 12
Publisher: New York : American Institute of Physics
Abstract: A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni50Mn32Sn18 thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.
Keywords: Magnetic hysteresis; Atomic force microscopy; Martensitic phase transitions; Nickel; Exchange interactions; Coercive force; Thin film structure; Antiferromagnetism; Magnetic fields
DDC: 620
License: CC BY 3.0 Unported
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