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Title: Detection of electromagnetic inclusions using topological sensitivity
Authors: Wahab, AbdulAbbas, TasawarAhmed, NaveedZia, Qazi Muhammad Zaigham
Issue Date: 2016
Published in: Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik , Volume 2285, ISSN 2198-5855
Publisher: Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik
Abstract: In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.
Keywords: Electromagnetic imaging; topological derivative; localization; resolution analysis; stability analysis; medium noise; measurement noise
DDC: 510
License: This document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties.
Dieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
Appears in Collections:Mathematik



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