Please use this identifier to cite or link to this item: https://oar.tib.eu/jspui/handle/123456789/4741
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Title: TopUp SERS substrates with integrated internal standard
Authors: Patze, SophieHübner, UweWeber, KarinaCialla-May, DanaPopp, Jürgen
Publishers Version: https://doi.org/10.3390/ma11020325
Issue Date: 2018
Published in: Materials 11 (2018), Nr. 2
Publisher: Basel : MDPI
Abstract: Surface-enhanced Raman spectroscopy (SERS) is known as a molecular-specific and highly sensitive method. In order to enable the routine application of SERS, powerful SERS substrates are of great importance. Within this manuscript, a TopUp SERS substrate is introduced which is fabricated by a top-down process based on microstructuring as well as a bottom-up generation of silver nanostructures. The Raman signal of the support material acts as an internal standard in order to improve the quantification capabilities. The analyte molecule coverage of sulfamethoxazole on the surface of the nanostructures is characterized by the SERS signal evolution fitted by a Langmuir–Freundlich isotherm.
Keywords: SERS; TopUp SERS substrate; sulfamethoxazole; Langmuir–Freundlich isotherm
DDC: 620
License: CC BY 4.0 Unported
Link to License: https://creativecommons.org/licenses/by/4.0/
Appears in Collections:Ingenieurwissenschaften



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