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Title: Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co2MnGa thin films
Authors: Park, G.-H.Reichlova, H.Schlitz, R.Lammel, M.Markou, A.Swekis, P.Ritzinger, P.Kriegner, D.Noky, J.Gayles, J.Sun, Y.Felser, C.Nielsch, K.Goennenwein, S.T.B.Thomas, A.
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Issue Date: 2020
Published in: Physical Review B Vol. 101 (2020), No. 6
Publisher: College Park, MD : American Physical Society
Abstract: We report a robust anomalous Nernst effect in Co2MnGa thin films in the thickness regime between 20 and 50 nm. The anomalous Nernst coefficient varied in the range of -2.0 to -3.0 μV/K at 300 K. We demonstrate that the anomalous Hall and Nernst coefficients exhibit similar behavior and fulfill the Mott relation. We simultaneously measure all four transport coefficients of the longitudinal resistivity, transversal resistivity, Seebeck coefficient, and anomalous Nernst coefficient. We connect the values of the measured and calculated Nernst conductivity by using the remaining three magnetothermal transport coefficients, where the Mott relation is still valid. The intrinsic Berry curvature dominates the transport due to the relation between the longitudinal and transversal transport. Therefore, we conclude that the Mott relationship is applicable to describe the magnetothermoelectric transport in Weyl semimetal Co2MnGa as a function of film thickness.
Keywords: Cobalt alloys; Gallium alloys; Manganese alloys; Ternary alloys; Co2MnGa; Longitudinal resistivity; Nernst coefficients; Nernst effect; Thickness dependence; Thickness regime; Transport coefficient; Thin films
DDC: 530
License: CC BY 4.0 Unported
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